The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 04, 2020
Applicant:

Shoei Chemical Inc., Tokyo, JP;

Inventors:

Naoki Umeda, Tosu, JP;

Takafumi Moriyama, Tosu, JP;

Hirokazu Sasaki, Tosu, JP;

Keisuke Matsuura, Tosu, JP;

Assignee:

SHOEI CHEMICAL INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 11/88 (2006.01); B82Y 20/00 (2011.01); B82Y 40/00 (2011.01); C09K 11/02 (2006.01); C09K 11/08 (2006.01); C09K 11/70 (2006.01);
U.S. Cl.
CPC ...
C09K 11/883 (2013.01); B82Y 20/00 (2013.01); B82Y 40/00 (2013.01); C09K 11/02 (2013.01); C09K 11/0883 (2013.01); C09K 11/703 (2013.01); C01P 2004/50 (2013.01); C01P 2004/64 (2013.01); C01P 2004/80 (2013.01);
Abstract

A semiconductor nanoparticle aggregate that is an aggregate of core/shell type semiconductor nanoparticles including a core including In and P and a shell having one or more layers, in which a peak wavelength of an emission spectrum of the semiconductor nanoparticle aggregate is from 515 nm to 535 nm and a full width at half maximum of the emission spectrum is 43 nm or less. For each semiconductor nanoparticle, (1) an average value of a full width at half maximum of an emission spectrum is 15 nm or more, (2) a standard deviation of a peak wavelength of the emission spectrum is 12 nm or less, and (3) a standard deviation of the full width at half maximum of the emission spectrum is 2 nm or more.


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