The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 11, 2023
Applicant:

Pfu Limited, Kahoku, JP;

Inventor:

Masaaki Sakai, Kahoku, JP;

Assignee:

PFU LIMITED, Kahoku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/12 (2006.01); B65H 3/06 (2006.01); B65H 7/18 (2006.01);
U.S. Cl.
CPC ...
B65H 7/125 (2013.01); B65H 3/063 (2013.01); B65H 7/18 (2013.01); B65H 2511/13 (2013.01); B65H 2553/30 (2013.01); B65H 2553/82 (2013.01);
Abstract

A medium conveying apparatus includes a conveying roller to convey a medium, an overlap detection sensor, a processor to detect an overlap portion in which it is determined that an overlap has occurred on the medium based on a detection output by the overlap detection sensor for the medium conveyed by the conveying roller, calculate an overlap length where the overlap portion is continuous based on a detection result of the overlap portion, determine whether a multi-feed has occurred based on the overlap length, and execute an abnormal processing for the multi-feed based on a determination result of the multi-feed. The processor determines that a first overlap portion and a second overlap portion are continuous when a distance between the first overlap portion and the second overlap portion is within a predetermined distance in calculating the overlap length.


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