The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Dec. 14, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Kazuaki Sakurada, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 3/407 (2006.01); G06K 15/02 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 3/4078 (2013.01); G06K 15/021 (2013.01); G06K 15/027 (2013.01);
Abstract

A control unit acquires an interval between weaving threads in a woven fabric, and changes an interval between ruled lines constituting a ruled line group in a test pattern on the basis of the acquired interval between weaving threads. When the interval between weaving threads in the woven fabric matches the interval between ruled lines constituting the ruled line group in the test pattern or when these intervals are in the relationship of integer multiple, ruled lines in the test pattern match the interval between weaving threads in the woven fabric. When they match, it is difficult to recognize the difference between the test pattern and the shadow of the weaving thread in the woven fabric. The control unit changes the interval between ruled lines constituting the ruled line group in the test pattern on the basis of the interval between weaving threads. This enables the difference recognition to be less difficult.


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