The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Aug. 30, 2024
Applicant:

Sybridge Technologies U.s. Inc., Southfield, MI (US);

Inventors:

Charles David Wood, Highland Park, IL (US);

Quinn Fitzgerald Gaughan, Chicago, IL (US);

William Paul King, Champaign, IL (US);

Neil Thomas Jobin, Tecumseh, CA;

Assignee:

SyBridge Technologies U.S. Inc., Southfield, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 45/76 (2006.01);
U.S. Cl.
CPC ...
B29C 45/768 (2013.01); B29C 2945/76163 (2013.01); B29C 2945/76949 (2013.01);
Abstract

The present disclosure relates to attachable monitoring devices for molding tools. One example embodiment includes a method. The method includes receiving, by a first computing device and from a monitoring device that includes a plurality of sensors, a plurality of sensor readings associated with operation of an injection press or with a mold usable by the injection press. The plurality of sensor readings were collected by the monitoring device when the monitoring device was attached to an exterior of the mold. The method also includes determining, by the first computing device, one or more metrics associated with a state of the injection press or a state of the mold. Determining the one or more metrics includes applying a machine-learned model to the plurality of sensor readings. Further, the method includes providing, by the first computing device to a second computing device, the one or more metrics.


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