The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Mar. 29, 2019
Siemens Energy Global Gmbh & Co. KG, Munich, DE;
University of Waterloo, Waterloo, CA;
Ali Bonakdar, Nuns Island, CA;
Farzad Liravi, Kitchener, CA;
Ehsan Toyserkani, Waterloo, CA;
Usman Ali, Waterloo, CA;
Shoja'edin Chenouri, Waterloo, CA;
Yahya Mahmoodkhani, Waterloo, CA;
Siemens Energy Global GmbH & Co. KG, Munich, DE;
University of Waterloo, Waterloo, CA (US);
Abstract
A method is provided for determining optimal values of significant process parameters in an additive manufacturing (AM) process for printing a part from a specified process material. The method involves defining a set of target output material properties to be optimized and identifying an initial set of process parameters pertaining to the AM process. The method broadly comprises a screening phase and an optimization phase. The screening phase involves generating and executing a first experiment design, and determining, based on a first output response, a subset of significant process parameters that affect the target output material properties. The optimization phase involves generating and executing a second experiment design, and determining, based on a second output response, optimal values for the significant process parameters that maximize or minimize the target output material properties.