The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Apr. 23, 2021
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Yasuo Kishimoto, Tokyo, JP;

Futoshi Ogasawara, Tokyo, JP;

Yasuyoshi Takao, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/342 (2006.01); G06T 7/62 (2017.01); H04N 23/69 (2023.01);
U.S. Cl.
CPC ...
B07C 5/3422 (2013.01); G06T 7/62 (2017.01); H04N 23/69 (2023.01); B07C 2501/0054 (2013.01); Y02P 10/20 (2015.11);
Abstract

Provided are a scrap determination system and method that can improve scrap determination techniques. A scrap determination system () comprises: a first scrap determination model () generated using teaching data including first learning images, and determines, based on a camera image, grade of scrap in the image and a ratio of the grade; a second scrap determination model () generated using teaching data including second learning images, and determines, based on the image, grade of scrap in the image and a ratio of the grade; a selection model () configured to determine which of the first scrap determination model () and the second scrap determination model () is to be used, based on the image; and an output section () configured to output information of each grade of scrap and a ratio of the grade determined based on the image using the model selected by the selection model ().


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