The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Jan. 13, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yu-Tai Li, Taichung, TW;

Chia-Jen Lin, New Taipei, TW;

Wei-Yu Lin, Zhubei, TW;

Kao-Chi Lin, Kaohsiung, TW;

Cho-Fan Hsieh, Yilan County, TW;

Teng-Chun Wu, Kinmen County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01); B01L 3/00 (2006.01); G01N 21/3581 (2014.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502715 (2013.01); G01N 21/3581 (2013.01); G01N 21/554 (2013.01); B01L 2300/04 (2013.01); G01N 2021/5903 (2013.01);
Abstract

A microfluidic sensor chip includes a body comprising a substrate and an upper cover, and the upper cover having at least one opening, at least one microfluidic channel formed on the substrate and has a supporting surface, wherein the at least one microfluidic channel communicates with the at least one opening, and a metamaterial layer coated on the supporting surface, wherein the metamaterial layer has a plurality of regions, and each region has a corresponding resonance pattern. The present disclosure further provides a measuring system for microfluidic sensor chip includes a carrying board, a plurality of the microfluidic sensor chips, a transmitter emitting a terahertz wave corresponding to the resonance pattern of one of the microfluidic sensor chips, a receiver receiving a reflected wave corresponding to the terahertz wave, and a processor receiving the reflected wave from the processor, and determining a testing sample characteristic according to the reflected wave.


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