The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
May. 20, 2020
Hologic, Inc., Marlborough, MA (US);
Thomas Kelly, Woburn, MA (US);
Kevin Wilson, Acton, MA (US);
Mark Guetersloh, Bedford, MA (US);
Wei Wang, Wellesley Hills, MA (US);
Hologic, Inc., Marlborough, MA (US);
Abstract
A dual-energy X-ray absorptiometry ('DXA') system includes an x-ray source assembly comprising a source carriage to move the x-ray source assembly along a scan path, the scan path comprising an active scan portion and a reference measurement portion. A detector assembly including a detector carriage to move the detector assembly with the source assembly and to collect scan data at active scan portions. A support structure supporting the source and detector assemblies. A calibration controller coupled a calibration element having a known x-ray attenuation value and configured position the calibration element between the source and detector assemblies during the reference measurement portion and to remove the calibration element from between the source and detector assemblies during the active scan portion. A processing unit operable to compare the reference measurement against an expected reference value to identify a variance and to selectively trigger an action in response to the variance.