The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Apr. 15, 2024
Applicant:

Ibex Innovations Limited, Sedgefield, GB;

Inventors:

Paul Scott, Sedgefield, GB;

Neil Loxley, Sedgefield, GB;

Adam Ratcliffe, Sedgefield, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); A61B 6/00 (2006.01); G06T 3/4007 (2024.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); G06T 3/4007 (2013.01); G06T 5/70 (2024.01); G06T 7/0014 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method of performing scatter correction on an X-ray image is disclosed. The method comprises obtaining an input image for processing based on a source X-ray image of a sample acquired using an X-ray detector, and determining a model of the sample based on the input image. The model is then evaluated by computing, based on the model, simulated X-ray image data and evaluating the simulated image data against the input image to determine whether a convergence criterion is fulfilled. An updated model of the sample is generated if the convergence criterion is not fulfilled. The model evaluating step is repeated based on one or more successive updated models until the convergence criterion is fulfilled in a final iteration, and scatter correction is then performed on the source X-ray image using simulated image data computed during the final iteration.


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