The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Oct. 11, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Takaya Yamamoto, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/46 (2024.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
A61B 6/463 (2013.01); A61B 6/487 (2013.01); A61B 6/5258 (2013.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01);
Abstract

An X-ray fluoroscopic imaging apparatus includes an imaging unit, an X-ray image acquisition unit configured to acquire an X-ray image, a target distribution learning identification unit for outputting distribution of a target appearing in an X-ray image using a learning model, an image quality improvement processing unit, and a display unit. The image quality improvement processing unit is configured to switch, using a learning identification result by a target distribution learning identification unit, between a first image processing mode for performing image quality improvement processing on an X-ray image and a second image processing mode for performing image quality improvement processing on the X-ray image without using the learning identification result.


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