The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Apr. 13, 2021
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Jie Cui, Cupertino, CA (US);
Yuqin Chen, Beijing, CN;
Chunxuan Ye, San Diego, CA (US);
Dawei Zhang, Cupertino, CA (US);
Hong He, Cupertino, CA (US);
Manasa Raghavan, Cupertino, CA (US);
Oghenekome Oteri, San Diego, CA (US);
Weidong Yang, San Diego, CA (US);
Wenshu Zhang, San Diego, CA (US);
Yang Tang, Cupertino, CA (US);
Assignee:
APPLE INC., Cupertino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 16/14 (2009.01); H04W 36/00 (2009.01); H04W 36/14 (2009.01); H04W 76/16 (2018.01); H04W 88/06 (2009.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 16/14 (2013.01); H04W 36/00698 (2023.05); H04W 36/1446 (2023.05); H04W 76/16 (2018.02); H04W 88/06 (2013.01); H04B 17/318 (2015.01);
Abstract
This disclosure describes techniques for NR-U MO merging in EN-DC and NR-DC embodiments, with consideration of additional parameters including different Q values and RSSI Measurement Timing Configuration (RMTC) configurations.