The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Mar. 10, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Shinki Jeong, Hwaseong-si, KR;

Hyungsun Ryu, Suwon-si, KR;

Seongkwan Lee, Yongin-si, KR;

Jaemoo Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 25/76 (2023.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); H01R 13/24 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01R 1/07307 (2013.01); G01R 31/2889 (2013.01); H04N 25/76 (2023.01); H01R 13/24 (2013.01);
Abstract

A testing system for testing an image sensor, includes a probe card, a pogo block receiving output signals of the probe card, an interface board configured to receive output signals of the pogo block, convert the received output signals of the pogo block, and output the converted signals through a cable, and a testing apparatus connected to the interface board through the cable. The testing apparatus is configured to test the device under test through signals received through the cable. The interface board includes an active interface module configured to amplify the received output signals of the pogo block, convert the amplified signals into signals having a same frequency as the received output signals of the pogo block, and transmit the converted signals to the cable.


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