The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Feb. 27, 2024
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Liran Dreval, Mountain View, CA (US);

Itay Margolin, Petah Tikva, IL;

Meghan Mergui, Ramat Gan, IL;

Aviv Ben Arie, Ramat Gan, IL;

Assignee:

INTUIT INC., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 51/212 (2022.01); G06F 40/194 (2020.01); G06F 40/284 (2020.01);
U.S. Cl.
CPC ...
H04L 51/212 (2022.05); G06F 40/194 (2020.01); G06F 40/284 (2020.01);
Abstract

Aspects of the present disclosure relate to detecting spam messages. Embodiments include creating condensed vector representations of messages; calculating similarity scores for each message relative to other messages using the vector representations; associating messages of the plurality of messages with a grouping based on the calculated similarity score for the messages within the grouping exceeding a threshold; determining that a grouping of messages are spam messages by comparing an amount of messages of the grouping of messages sent within a first time window to an amount of messages of the grouping of messages sent within a second time window, wherein the second time window comprises a time period preceding the first time window; providing the identified spam message to a machine learning model; and training the machine learning model by iteratively adjusting parameters of the model based on tracking the identified spam message through multiple layers of the model.


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