The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 10, 2023
Fujitsu Limited, Kawasaki, JP;
Yangyang Fan, Beijing, CN;
Zhenning Tao, Beijing, CN;
Fujitsu Limited, Kawasaki, JP;
Abstract
Embodiments of this disclosure provide a measurement apparatus and method for nonlinear damages in an optical link. The apparatus may include a processor to control execution of a process to generate multiple band-notch signals with different band-notch widths corresponding to a frequency point to be measured; and calculate respective multiple nonlinear noise-to-power ratios at the frequency point to be measured according to multiple band-notch signals obtained after the multiple band-notch signals with different band-notch widths pass through the optical link. A real nonlinear noise-to-power ratio may be extrapolated at the frequency point to be measured according to the multiple nonlinear noise-to-power ratios corresponding to the multiple band-notch signals with different band-notch widths.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile