The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Mar. 03, 2022
Applicant:

Lenovo (Beijing) Limited, Beijing, CN;

Inventors:

Yao Zhang, Beijing, CN;

Jiang Tian, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06F 18/25 (2023.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06F 18/251 (2023.01); G06F 18/253 (2023.01); G06V 10/40 (2022.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20221 (2013.01);
Abstract

An image processing method includes obtaining a first quantity of to-be-analyzed images and performing fusion and enhancement processing on the first quantity of to-be-analyzed images through an image analysis model to obtain a first target image. Each to-be-analyzed image corresponds to a different target modality of a target imaging object. The first target image is used to enhance display of a distribution area of an analysis object of the first quantity of to-be-analyzed images. The analysis object belongs to the imaging object. The image analysis model is obtained by training a second quantity of sample images corresponding to different sample modalities. The first quantity is less than or equal to the second quantity. The target modality belongs to the sample modalities.


Find Patent Forward Citations

Loading…