The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Feb. 13, 2023
Raytheon Technologies Corporation, Farmington, CT (US);
Luke B. Borkowski, West Hartford, CT (US);
Kevin L. Rugg, Fairfield, CT (US);
RTX CORPORATION, Farmington, CT (US);
Abstract
A method of analyzing computed tomography data includes creating a mesh of a sampling surface that extends through a component to obtain a meshed surface; creating a plurality of additional surfaces that are different from each other and from the meshed surface, and that each correspond to one or more of a translation and a rotation of the meshed surface; querying an interpolant function, which is fitted to CT data of the component, at a plurality of points of the meshed surface to project the CT data onto the meshed surface; querying the interpolant function at a plurality of points of the additional surfaces to project the CT data onto the additional surfaces; and determining, for each of the plurality of points of the meshed surface, whether the point is a void based on the querying for the meshed surface and the querying for the additional surfaces.