The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Jun. 01, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Zhen Jia, Shanghai, CN;

Zijia Wang, WeiFang, CN;

Kenneth Durazzo, Morgan Hill, CA (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/0631 (2023.01); G06F 16/28 (2019.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/06311 (2013.01); G06F 16/285 (2019.01); G06N 20/20 (2019.01); G05B 2219/25255 (2013.01);
Abstract

A method comprises generating a distilled dataset from an input dataset, wherein the input dataset comprises a plurality of first data samples, and the distilled dataset comprises a plurality of second data samples. In the method, an input data sample is received, and similarities are computed between the input data sample and respective ones of the plurality of second data samples. The method further comprises selecting one or more second data samples of the plurality of second data samples based, at least in part, on the computed similarities, and retrieving one or more first data samples of the plurality of first data samples from the input dataset based, at least in part, on the selected one or more second data samples. The generating is performed, at least in part, using one or more machine learning models.


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