The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Jan. 27, 2021
Applicant:

Lenovo (Singapore) Pte. Ltd., New Tech Park, SG;

Inventors:

Tabito Miyamoto, Yokohama, JP;

Eiji Shinohara, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/10 (2020.01);
Abstract

Methods for generating a measurement table including target identification information indicating a measurement target are disclosed herein. One method includes adding, by a processor, attribute information for a dimension value of a measurement target included in drawing data and a delimiter for identifying number information for the dimension value to the dimension value, adding the number information including a drawing sheet number and a dimension number for the measurement target to the delimiter, and generating a measurement table including target identification information indicating the measurement target corresponding to the drawing data and inspection standards based on dimension addition information. The attribute information is associated with the number information added to the delimiter and is based on the dimension value of the measurement target. Apparatus and systems that can perform the methods generating a measurement table including target identification information indicating the measurement target are also disclosed herein.


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