The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Sep. 20, 2021
Applicant:

Beijing Baidu Netcom Science Technology Co., Ltd., Beijing, CN;

Inventors:

Ruoyu Guo, Beijing, CN;

Yuning Du, Beijing, CN;

Weiwei Liu, Beijing, CN;

Xiaoting Yin, Beijing, CN;

Qiao Zhao, Beijing, CN;

Qiwen Liu, Beijing, CN;

Ran Bi, Beijing, CN;

Xiaoguang Hu, Beijing, CN;

Dianhai Yu, Beijing, CN;

Yanjun Ma, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 18/214 (2023.01); G06F 18/21 (2023.01); G06F 18/24 (2023.01);
U.S. Cl.
CPC ...
G06F 18/214 (2023.01); G06F 18/217 (2023.01); G06F 18/24 (2023.01);
Abstract

There is provided a method and apparatus of training a model, a device, and a medium, which relate to artificial intelligence, and in particular to a deep learning and image processing technology. The method may include: determining a plurality of augmented sample sets associated with a plurality of original samples; determining a first constraint according to a first model based on the plurality of augmented sample sets; determining a second constraint according to the first model and a second model based on the plurality of augmented sample sets, wherein the second constraint is associated with a difference between outputs of the first model and the second model for one augmented sample, and the first model has a complexity lower than that of the second model; training the first model based on at least the first constraint and the second constraint, so as to obtain a trained first model.


Find Patent Forward Citations

Loading…