The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Jun. 06, 2024
Applicant:

Ancestry.com Dna, Llc, Lehi, UT (US);

Inventors:

Alisa Elnaz Sedghifar, San Francisco, CA (US);

Andre Everson Kim, Upland, CA (US);

Ju Zhang, San Jose, CA (US);

Ross Eugene Curtis, Cedar Hills, UT (US);

Natalie Anne Swinford, Saratoga Springs, UT (US);

Jeffrey Adrion, Salt Lake City, UT (US);

Yong Wang, San Mateo, CA (US);

Assignee:

Ancestry.com DNA, LLC, Lehi, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06F 16/35 (2019.01);
Abstract

A computing device may receive an inheritance dataset of a target named entity. The device may access a plurality of clusters associated with a region, each cluster comprising inheritance data for a plurality of reference panel named entities. The device may determine that the inheritance dataset of the target named entity has at least a threshold amount of inheritance sequences that are classified to the region. The device may compare, for each cluster, the inheritance dataset of the target named entity to the reference panel named entities in the cluster to identify similarities and shared inheritance segments between the target named entity and the reference panel named entities. The device may determine, for each cluster, a metric based on the inheritance segments shared. The device may assign the target named entity to one or more ethnicities based on the comparison between the metric and the threshold specific to the cluster.


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