The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 22, 2024
Applicant:
Beken Corporation, Shanghai, CN;
Inventors:
Zhifu Liu, Shanghai, CN;
Zhilei Wang, Shanghai, CN;
Pujie Yang, Shanghai, CN;
Caogang Yu, Shanghai, CN;
Assignee:
Beken Corporation, Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/0875 (2016.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0875 (2013.01); G06F 12/0246 (2013.01); G06F 2212/452 (2013.01);
Abstract
A fetch process for a computing system is described herein. The computing system comprises a non-transitory memory. In the non-transitory memory, instructions are stored in Cycle-Redundancy Blocks (CRC blocks). Each of these CRC blocks comprises a first CRC code associated with the instructions stored in the CRC block. During a fetch process, the computing system generates a second CRC code based on the instructions stored in the CRC block and compares the second CRC code with the first CRC code to ascertain the success of the fetch process.