The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Jul. 11, 2024
Applicant:
Phaidra, Inc., Seattle, WA (US);
Inventors:
Christopher R. Vause, Austin, TX (US);
Frank Nerkowski, Seattle, WA (US);
Raahul Singh, Seattle, WA (US);
Assignee:
Phaidra, Inc., Seattle, WA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/0265 (2013.01);
Abstract
In variants, a method for industrial process control can include: determining AI setpoint values using an AI agent; determining local setpoint values using a local control system; selecting a setpoint source from a set of candidate setpoint sources including the AI agent and the local control system; optionally determining a set of transition setpoint values based on setpoints provided by the setpoint source; and limiting the setpoint values; wherein the industrial system is operated based on the limited setpoint values.