The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Nov. 07, 2023
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventor:

Timothy L. Wong, St. Paul, MN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 27/005 (2013.01); G02B 5/3041 (2013.01);
Abstract

Optical systems including a reflective polarizer are described. The reflective polarizer includes first and second reflection zones, such that for light substantially normally incident on the reflective polarizer, the first zone substantially reflects light in a first wavelength range and substantially transmits light in a different non-overlapping second wavelength range, and the second zone substantially reflects light in the second wavelength range and substantially transmits light in the first wavelength range. The first and second reflection zones have first and second thicknesses having corresponding first and second mid-points separated by a distance d. In some embodiments, a longitudinal chromatic aberration of the optical imaging system of the first wavelength range to the second wavelength range caused when reducing d so that the first and second reflection zones are immediately adjacent is a distance h where 0.3 h≤d≤0.7 h.


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