The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Apr. 08, 2020
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Patric Pelzer, Wetzlar, DE;
Christian Schumann, Lich, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); B01L 3/5085 (2013.01); B01L 2200/025 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/12 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/168 (2013.01);
Abstract
A device for receiving samples in a microscope is provided. The device comprises a microtiter plate. The microtiter plate comprises an inner part with cavities for the samples and with an optically transparent bottom plate, which seals the cavities underneath and a frame which defines a supporting surface and is configured to hold the inner part at least in a first position. The bottom plate is arranged above the supporting surface in the first position of the inner part. The inner part is movable relative to the frame along a direction (A) perpendicular to the supporting surface.