The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 29, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An optical arrangement for an inclined-plane microscope, includes: an optical illumination and detection arrangement, an optical erecting unit for imaging the real intermediate image on a detector, wherein an optical axis of the erecting unit is inclined with respect to an optical axis of the optical illumination and detection arrangement and is oriented substantially perpendicularly to the real intermediate image plane, and an attachment element arranged on the erecting unit, extending in a direction of the real intermediate image, and forming an interface which is oriented substantially parallel to the real intermediate image plane, wherein beam paths of the illumination light and of the scattered and/or fluorescent light transmitted by the illumination and detection arrangement are coupled in and intersect on the image side of the illumination and detection arrangement, and wherein the beam path of the illumination light is spaced apart from the interface.