The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Nov. 30, 2022
Indian Institute of Technology Kharagpur, Kharagpur, IN;
Texas Instruments Incorporated, Dallas, TX (US);
Sayandeep Sanyal, Kharagpur, IN;
Pallab Dasgupta, Kharagpur, IN;
Aritra Hazra, Kharagpur, IN;
Scott Morrison, Dallas, TX (US);
Sudhakar Surendran, Bangalore, IN;
Lakshmanan Balasubramanian, Bangalore, IN;
Indian Institute of Technology Kharagpur, Kharagpur, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Various embodiments disclosed herein provide for a glitch detection and level detection method that use information contained in the signal itself to determine at which resolution or granularity the glitch detection and level detection operates. In particular, the glitch detection method comprises defining a glitch in terms of a change in the area under the waveform which can serve to disambiguate glitches from noises and other transient side effects of level transmissions. Likewise, the level detection method uses an entropy-based metric to identify levels that are significant in context of the entire signal and not in absolute terms.