The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Aug. 03, 2022
Fujifilm Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Takuro Sugiyama, Kanagawa, JP;
Yuko Terao, Kanagawa, JP;
Yasuhiko Hirana, Kanagawa, JP;
Tetsuro Otsuka, Kanagawa, JP;
Akinori Sugishima, Kanagawa, JP;
Yasuharu Shiraishi, Kanagawa, JP;
Takafumi Hirata, Tokyo, JP;
Yoshiki Makino, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
Provided are a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing an organic substance and having a small variation in signal intensity of an ion of a metal element depending on a measurement position; a standard sample; a method for producing a standard sample film; a sample set; a quantitative analysis method; and a transfer film. The standard sample film of the present invention is a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing a polymer and a metal element, and having a maximum height difference in film thickness of the standard sample film of 0.50 μm or less.