The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 02, 2022
General Inspection, Llc, Davisburg, MI (US);
Mike Nygaard, Grand Blanc, MI (US);
Nathan Kujacznski, Swartz Creek, MI (US);
Nadaly Marchi, Holly, MI (US);
General Inspection, LLC, Davisburg, MI (US);
Abstract
An inspection system configured to scan internal surfaces of manufactured components includes an optical probe, a light source, a conical mirror, and an imaging sensor. The optical probe has a field of view. The light source is spaced apart from the optical probe and is positioned within the field of view of the optical probe. The conical mirror is secured to the light source and is configured to transform light emitted from the light source into a light disc. The light disc is configured to be projected onto the internal surfaces of the manufactured components while scanning the internal surfaces. The imaging sensor is configured to receive reflections of the light disc from the internal surfaces via the optical probe while scanning the internal surfaces.