The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Sep. 10, 2021
Daicel Corporation, Osaka, JP;
Motofumi Suzuki, Kyoto, JP;
Takao Fukuoka, Kyoto, JP;
Youji Suzuki, Tokyo, JP;
Ryouta Nakamura, Tokyo, JP;
Katsuya Maruo, Tokyo, JP;
DAICEL CORPORATION, Osaka, JP;
Abstract
Provided are an equol determination kit that selectively determines equol with high sensitivity by surface-enhanced Raman scattering, and a method for selectively determining equol with high sensitivity by surface-enhanced Raman scattering. The equol determination kit of the present disclosure determines equol by the surface-enhanced Raman scattering spectroscopy. The method for determination of equol of the present disclosure is a method for determination of equol by the surface-enhanced Raman scattering spectroscopy. In the method, equol is preferably determined by analyzing a peak found in at least one wavelength region selected from the group consisting of 1530 to 1630 cm, 1230 to 1330 cm, 1140 to 1240 cm, and 535 to 635 cm.