The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Nov. 09, 2023
Applicant:

Essenlix Corporation, Monmouth Junction, NJ (US);

Inventors:

Stephen Y. Chou, Princeton, NJ (US);

Wei Ding, East Windsor, NJ (US);

Ji Qi, Skillman, NJ (US);

Jun Tian, Belle Mead, NJ (US);

Wu Chou, Basking Ridge, NJ (US);

Assignee:

Essenlix Corporation, Monmouth Junction, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); A61K 31/7088 (2006.01); A61K 45/06 (2006.01); A61K 47/54 (2017.01); A61P 31/04 (2006.01); C12N 15/113 (2010.01); G01N 1/28 (2006.01); G01N 21/25 (2006.01); G01N 21/64 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); A61K 31/7088 (2013.01); A61K 45/06 (2013.01); A61K 47/554 (2017.08); A61P 31/04 (2018.01); C12N 15/113 (2013.01); C12N 15/1137 (2013.01); G01N 1/2813 (2013.01); G01N 21/25 (2013.01); G01N 21/6458 (2013.01); G01N 33/49 (2013.01); C12N 2310/127 (2013.01); C12N 2310/3515 (2013.01); C12Y 305/02006 (2013.01); G01N 2021/035 (2013.01); G01N 2021/6439 (2013.01); G01N 2201/0221 (2013.01);
Abstract

Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between two plates.


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