The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Apr. 29, 2021
Universität Für Bodenkultur Wien, Vienna, AT;
Petrus Dominicus Joannes Van Oostrum, Vienna, AT;
Erik Olof Reimhult, Vienna, AT;
Universität für Bodenkultur Wien, Vienna, AT;
Abstract
A method for determining a property of at least one particle in a medium, wherein the method comprises: emitting a coherent light beam to irradiate a sample of the medium; recording an interference image of a first part of the light beam scattered by the at least one particle and a second part of the light beam not scattered by particles; computing, for positions within the sample, an electric field of the first part from the interference image; generating a representation comprising for each position, a phase value determined from the computed electric field and from an estimated electric field of the second part, and an intensity value determined from the intensity of the first part and from the phase value; and determining said property using the representation.