The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2025
Filed:
Mar. 17, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Satoshi Takahashi, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
Provided is a particle quantifying device in which there is a wider range of the number of particles that can be accurately recognized in a particulate sample. An observation devicecomprises an imaging camerathat acquires a sample image representing a particulate sample and a computerthat performs a computation process relating to the sample image. The computeracquires a frequency domain representation of the sample image, separates the frequency domain representation into a high-frequency component and a low-frequency component, acquires a high-frequency image as a spatial domain representation of the high-frequency component, acquires a low-frequency image as a spatial domain representation of the low-frequency component, and recognizes or quantifies the particulate sample on the basis of the high-frequency image and the low-frequency image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile