The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Sep. 23, 2021
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Ahmed Fouda, Houston, TX (US);

Baris Guner, Houston, TX (US);

Mahmoud Eid Hussein Selim, Dhahran, SA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); E21B 47/002 (2012.01); G01R 27/26 (2006.01); G01V 3/18 (2006.01);
U.S. Cl.
CPC ...
G01N 15/08 (2013.01); E21B 47/0025 (2020.05); G01N 15/0806 (2013.01); G01R 27/2617 (2013.01); G01V 3/18 (2013.01); G01N 2015/0846 (2013.01); G01N 2015/0853 (2013.01);
Abstract

Systems and methods for obtaining a calibrated permittivity dispersion measurements of a subsurface formation by measuring an impedance of the subsurface formation using a borehole imager at a first one or more frequencies; measuring a permittivity of the subsurface formation using a reference tool at a second one or more frequencies; calculating a first dispersion curve of the permittivity of the subsurface formation based at least in part on the measured impedance of the subsurface formation at the first one or more frequencies; extrapolating the permittivity of the subsurface formation to the second one or more frequencies using the calculated first dispersion curve of the permittivity of the subsurface formation; calibrating the permittivity of the subsurface formation based at least in part on the extrapolated permittivity of the subsurface formation and the measured permittivity of the subsurface formation; and generating a second dispersion curve of the permittivity of the subsurface formation based at least in part on one or more of the calibrated permittivity of the subsurface formation at the first one or more frequencies and the measured permittivity of the subsurface formation at the second one or more frequencies.


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