The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Jul. 15, 2020
Applicant:

Maxell, Ltd., Kyoto, JP;

Inventor:

Tomohiko Mizuguchi, Kyoto, JP;

Assignee:

MAXELL, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01);
U.S. Cl.
CPC ...
A61B 5/4088 (2013.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01);
Abstract

A system for displaying the results of TMT test can acquire time-dependent changes in the position of a contact part on a coordinate plane as time-series coordinate data on the basis of an electric detection signal from a sensor, acquire an elapsed time associated with movement of the contact part as time data from a timer on the basis of the detection signal from the sensor, calculate a test value relating to the movement of the contact part on the basis of the data, and generate and output a characteristic image indicating a time-dependent change in the test value.


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Mizuguchi, Tomohiko. (2025). System, computer program and method for displaying tmt test result (U.S. Patent No. 12324676). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12324676

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