The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
May. 03, 2023
Applicant:
Adeia Imaging Llc, San Jose, CA (US);
Inventors:
Ting-Lan Lin, Da-an District, TW;
Tao Chen, Palo Alto, CA (US);
Assignee:
Adeia Imaging LLC, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 21/2343 (2011.01); H04N 21/4402 (2011.01);
U.S. Cl.
CPC ...
H04N 21/2343 (2013.01); H04N 21/4402 (2013.01);
Abstract
Systems, methods and apparatuses are described herein for accessing image data that comprises a plurality of macropixels, wherein the image data may be generated using a device comprising a lenslet array. The image data may be decomposed into a plurality of components using Kronecker product singular value decomposition (KP-SVD). Each component of the plurality of components may be encoded. Each encoded component of the plurality of components may be transmitted to cause display of reconstructed image data based on decoding each encoded component of the plurality of components.