The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
May. 09, 2022
Zoox, Inc., Foster City, CA (US);
Derek Adams, Pasadena, CA (US);
Zakieh Sadat Hashemifar, Sunnyvale, CA (US);
Agis Iakovos Mesolongitis, Oakland, CA (US);
Zoox, Inc., Foster City, CA (US);
Abstract
Techniques for determining a probability that a first sensor is miscalibrated with respect a second sensor are discussed herein. For example, a computing device may receive calibrated extrinsics of a camera to a lidar, determine a plurality of sets of perturbed extrinsics based on the calibrated extrinsics, determine respective costs for perturbed extrinsics of the plurality of sets of perturbed extrinsics based on image data captured by the camera, the plurality of sets of perturbed extrinsics, and lidar data captured by the lidar, and determine a local maxima score for the calibrated extrinsics based at least in part on the respective costs for the perturbed extrinsics of the plurality of sets of perturbed extrinsics and a cost of the calibrated extrinsics. The computing device may then determine a probability that the camera is miscalibrated based on a Bayes probability and the local maxima score.