The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Apr. 04, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Navid Abedini, Basking Ridge, NJ (US);

Jianghong Luo, Skillman, NJ (US);

Muhammad Nazmul Islam, Littleton, MA (US);

Ashwin Sampath, Skillman, NJ (US);

Junyi Li, Fairless Hills, PA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/155 (2006.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01);
U.S. Cl.
CPC ...
H04B 7/155 (2013.01); H04B 17/318 (2015.01); H04B 17/336 (2015.01);
Abstract

A method, a computer-readable medium, and an apparatus are provided. The apparatus may be a repeater node. The apparatus may receive, at one or more first antennas of the node, a first signal via at least one first beam. The apparatus may measure, at one or more third antennas of the node, at least one of a power or a quality of at least one third beam. The at least one of the power or the quality of the at least one third beam may be measured at a same time as the first signal is received. The apparatus may forward, at one or more second antennas of the node, the first signal via at least one second beam.


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