The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Aug. 22, 2023
Applicant:

Marvell Asia Pte Ltd, Singapore, SG;

Inventors:

Stephane Dallaire, Gatineau, CA;

Ray Luan Nguyen, Fountain Valley, CA (US);

Geoffrey Hatcher, Lake Forest, CA (US);

Assignee:

Marvell Asia Pte Ltd, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 7/38 (2006.01); H03F 3/19 (2006.01); H04B 1/16 (2006.01);
U.S. Cl.
CPC ...
H03H 7/38 (2013.01); H03F 3/19 (2013.01); H04B 1/16 (2013.01);
Abstract

An analog front-end (AFE) device includes a sampler array, differential source follower circuits, and programmable attenuation circuits. The sampler array receives input and clock signals. The sampler array including sampling circuits each sampling and holding the input signal based on one of the clock signals. The differential source follower circuits include respective cross-coupled transistor circuits, which include cross-coupled transistors that adjust gain of the sampling circuits. The programmable attenuation circuits include a voltage-controlled resistor that is connected to a differential output of one of the cross-coupled transistor circuits and adjusts gain of a corresponding one of the sampling circuits. The programmable attenuation circuits further receive outputs of the sampling circuits and control signals, and, based on the control signals, adjust the gain for ones of the sampling circuits independently of other ones of the sampling circuits to compensate for gain mismatch between outputs of the sampling circuits.


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