The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Apr. 12, 2023
Applicant:

Virtek Vision International Inc, Waterloo, CA;

Inventors:

Ahmed Elhossini, Waterloo, CA;

David Paul Smith, Kitchener, CA;

Mehrdad Bakhtiari, Kitchener, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G06T 7/00 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/73 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30161 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system for identifying accurate assembly of a component to a workpiece is disclosed. The system includes a light source for projecting light indicia onto the component assembled to the workpiece. A controller includes an artificial intelligence (AI) element defining a machine learning model that establishes a convoluted neural network trained by stored images of light indicia projected onto the component assembled to the workpiece. An imager includes an image sensor system for imaging the workpiece and signaling a current image of the workpiece to the controller. The machine learning model directs inspection of the workpiece to the light indicia imaged by said imager. The AI element determines disposition of the component disposed upon the workpiece through the neural network identifying distortions of the light indicia in the current image.


Find Patent Forward Citations

Elhossini, Ahmed. (2025). Method and system for inspecting a surface with artificial intelligence assist (U.S. Patent No. 12322085). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12322085

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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