The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Jan. 18, 2021
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Tatsuya Okano, Kanagawa, JP;

Ryo Nakazato, Kanagawa, JP;

Atsuya Tokinosu, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06V 10/60 (2022.01); G06V 10/774 (2022.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06T 5/50 (2013.01); G06T 7/62 (2017.01); G06V 10/25 (2022.01); G06V 10/56 (2022.01); G06V 10/60 (2022.01); G06V 10/774 (2022.01); G06V 20/70 (2022.01); G06T 2207/20221 (2013.01);
Abstract

A learning data generation device that can generate learning data suitable for learning of an identification model. The learning data generation device has a function of cutting out part of first image data as second image data, a function of generating a two-dimensional graphic corresponding to the area of the second image data and representing a pseudo defect, a function of generating third image data by combining the second image data and the two-dimensional graphic, and a function of assigning a label corresponding to the two-dimensional graphic to the third image data. By using the third image data for learning of the identification model, a highly accurate identification model can be generated.


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