The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jul. 24, 2023
Hand Held Products, Inc., Charlotte, NC (US);
Jean-Luc Courtemanche, Charlotte, NC (US);
Liu Hongyan, Charlotte, NC (US);
Weihua Guan, Charlotte, NC (US);
Li Jian, Charlotte, NC (US);
Maryam Nikizad, Charlotte, NC (US);
Javier Enrique Gonzalez Barajas, Charlotte, NC (US);
Hand Held Products, Inc., Charlotte, NC (US);
Abstract
Embodiments of the present disclosure relate to utilizing geometric image cropping for improved image processing. Such geometric image cropping improves efficiency and/or throughput of various image processing tasks, for example for reading a machine-readable symbology via a specially-configured scanner. Some embodiments generate cropping parameter(s) using raytracing projections from lens data and ranging data for use in cropping image(s). Some embodiments generate cropping parameter(s) using magnification estimation for use in cropping image(s). Generated cropping parameter(s) may be stored via a reader, for example to a range-parameter table, to efficiently be retrieved and utilized for cropping subsequently captured images while remaining accurate and efficient for image processing.