The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Mar. 08, 2019
Applicant:

Micro Focus Llc, Santa Clara, CA (US);

Inventors:

Er-Xin Shang, Shanghai, CN;

Qian-Ru Zhai, Shanghai, CN;

Hao-Bin Cui, Shanghai, CN;

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/451 (2018.01); G06F 11/3668 (2025.01); G06V 10/20 (2022.01); G06V 10/40 (2022.01); G06V 30/10 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 9/454 (2018.02); G06V 10/20 (2022.01); G06V 10/40 (2022.01); G06V 30/10 (2022.01);
Abstract

According to examples, an apparatus may include a processor that may internationalize an automated test script that was generated to test a Graphical User Interface (GUI) in the first human language. When the GUI is internationalized into a second human language, the automated test script may no longer function. As such, the system may employ computer vision techniques to analyze the GUI in the first human language and the GUI in the second human language to identify text and GUI elements that correlate with one another. Based on the correlation, the system may internationalize the automated test script to function on the GUI in the second human language.


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