The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jan. 25, 2024
Intelligent Memory Limited, New Territories, HK;
Mike Hossein Amidi, Lake Forest, CA (US);
Intelligent Memory Limited, Kwai Chung, HK;
Abstract
A memory testing device uses a master control unit (MCU) to concurrently operate multiple, intelligent, slave control units (SCUs). The MCU or an SCU translates memory addresses of a device under test (DUT) into a matrix. The SCU accumulates error data by testing a test bit of the memory across multiple cells of the matrix, the accumulated error data is post-processed to determine if the test bit is faulty, and the process is repeated for additional test bits. The post-processed data is analyzed to identify one or more of the test bits as faulty, and then include in a test log preferably only a single instance of a memory address that corresponds to each of the one or more faulty test bits.