The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Mar. 26, 2020
T-head (Shanghai) Semiconductor Co., Ltd., Shanghai Free Trade Area, CN;
Arjun Chaudhuri, Hangzhou, CN;
Chunsheng Liu, Hangzhou, CN;
T-Head (Shanghai) Semiconductor Co., Ltd., Shanghai Free Trade Area, CN;
Abstract
The present invention facilitates efficient and effective information storage device operations. In one embodiment, a system comprises: a plurality of processing cores configured to process information and a debug system coupled to the plurality of cores. The plurality of processing cores are configured to perform respective test operations on the respective processing cores. The debug system is configured to gather results of the test operations on a flexible compaction basis, wherein a compacted indication of a passing test result is available at a debug cluster basis and compacted indications of a failed test result available at the debug cluster basis are further resolved to identify a failing processing core within the cluster. The processing cores are organized in clusters, wherein a set comprising more than one of the plurality of processing cores and less than all of the processing cores is considered a cluster. The processing cores can be organized in levels, wherein the number of processing cores in a cluster differs at different level. The different levels correspond to a debug hierarchy.