The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Sep. 30, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Beatriz San Miguel Gonzalez, Madrid, ES;

Aisha Naseer Butt, Hayes, GB;

Hiroya Inakoshi, London, GB;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 11/18 (2006.01); G06F 18/21 (2023.01); G06N 5/025 (2023.01);
U.S. Cl.
CPC ...
G06F 11/188 (2013.01); G06F 18/2185 (2023.01); G06N 5/025 (2013.01); G06N 20/20 (2019.01);
Abstract

A computer-implemented method of reconciling values of a feature, each value being provided by a different artificial intelligence (AI) system, by collecting logs from the different AI systems, each log including a value of the feature; identifying any discrepancy between the values. When there is any discrepancy, creating global information from the values, the global information taking into account some or all of the values. When the global information differs from the value of one of the AI systems, sending the global information to that AI system.


Find Patent Forward Citations

San Miguel Gonzalez, Beatriz. (2025). Method and system for reconciling values of a feature (U.S. Patent No. 12321245). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12321245

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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