The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Jan. 13, 2022
Applicant:

Cepheid, Sunnyvale, CA (US);

Inventors:

Marissa Lee, Sunnyvale, CA (US);

Jessica Koay, Sunnyvale, CA (US);

Charles Rohrs, Sunnyvale, CA (US);

Earl Solis, Sunnyvale, CA (US);

Matthew Piccini, Sunnyvale, CA (US);

Richard J. Casler, Jr., Sunnyvale, CA (US);

Assignee:

Cepheid, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05D 23/19 (2006.01); B01L 1/02 (2006.01); B01L 7/00 (2006.01); F25B 21/02 (2006.01); G01K 1/02 (2021.01); G01K 13/024 (2021.01); G01N 1/42 (2006.01); G01N 1/44 (2006.01);
U.S. Cl.
CPC ...
G05D 23/1931 (2013.01); B01L 1/025 (2013.01); B01L 7/52 (2013.01); F25B 21/02 (2013.01); G01K 1/026 (2013.01); G01K 13/024 (2021.01); G01N 1/42 (2013.01); G01N 1/44 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/1822 (2013.01); B01L 2300/1894 (2013.01);
Abstract

Thermal control devices and methods to provide improved control, speed and efficiency in temperature cycling are provided herein. Such thermal control device and methods can include one or more active elements, such a thermoelectric cooler device, that is controlled by an algorithm that regulates a temperature distribution of an adjacent reaction-vessel according to a temperature distribution command trajectory and estimated reaction-vessel temperature distribution. Some embodiments include two active elements that are bilaterally applied to opposing sides of the reaction-vessel. In some embodiments, the estimated reaction-vessel temperature is determined based on a state of power electronics of the element and a temperature output of one or more sensors of a portion of the element and/or an ambient environment of the reaction-vessel. Methods of calibration of such systems utilizing a thermal calibrator as a proxy for the reaction-vessel are also provided herein.


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