The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

May. 27, 2020
Applicant:

Essilor International, Charenton-le-pont, FR;

Inventors:

Benjamin Rousseau, Charenton-le-pont, FR;

Cyril Guilloux, Charenton-le-pont, FR;

Melanie Heslouis, Charenton-le-pont, FR;

Sebastien Fricker, Charenton-le-pont, FR;

Assignee:

Essilor International, Charenton-le-pont, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02C 13/00 (2006.01);
U.S. Cl.
CPC ...
G02C 13/005 (2013.01); G02C 2202/02 (2013.01);
Abstract

The invention relates to a method for determining at least an optical feature of an ophthalmic lens to be placed in a frame for vision correction of a subject, comprising: a) measuring () a value of a fitting parameter linked to the subject and/or the frame or a value of a dioptric parameter of the subject, thanks to a measurement process, b) providing () a level of uncertainty of said value measured in step a) depending on said measurement process, c) determining () said optical feature of said ophthalmic lens by taking into account said value measured in step a) and said level of uncertainty provided in step b).


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