The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Nov. 30, 2020
Yantai Raytron Technology Co., Ltd, Shandong, CN;
Peng Wang, Shandong, CN;
Chuanqing Yu, Shandong, CN;
YANTAI RAYTRON TECHNOLOGY CO., LTD, Shandong, CN;
Abstract
A composite lens and a manufacturing method, and an infrared detector. The composite lens comprises a substrate (); a lens () located on the first surface of the substrate (); and a first metasurface structure array () that is provided on the second surface of the substrate () according to the surface type machining error of the lens (), the first metasurface structure array () comprising a plurality of metasurface structure units. The first surface is opposite to the second surface. Because the lens () and the first metasurface structure array () are located on two different surfaces of the substrate (), after the lens () is manufactured, the first metasurface structure array () can be set according to the surface type of the lens (), so as to correct an aberration that is generated due to a surface type error when the lens () is machined; moreover, because the first metasurface structure array () can be set after the lens () is manufactured, the tolerance to a machining error is extremely high.