The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Feb. 19, 2021
Sony Group Corporation, Tokyo, JP;
Mitsunori Ueda, Tokyo, JP;
Seiji Wada, Tokyo, JP;
Takeshi Matsui, Tokyo, JP;
Hirokazu Tatsuta, Tokyo, JP;
Tetsuro Kuwayama, Tokyo, JP;
SONY GROUP CORPORATION, Tokyo, JP;
Abstract
High-speed and high-accuracy focus adjustment is achieved. A microscope system () includes: an irradiation unit () that emits line illumination parallel to a first direction; a stage () that supports a specimen and is movable in a second direction perpendicular to the first direction; a phase difference acquisition unit (I) that acquires phase difference information regarding an image of light emitted from the specimen by being irradiated with the line illumination; an objective lens () that focuses the line illumination on the specimen; a derivation unit (E) that derives relative position information between the objective lens and the specimen based on the phase difference information; and a movement control unit (F) that causes at least one of the objective lens and the stage to move in a third direction vertical to each of the first direction and the second direction based on the relative position information.