The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Feb. 05, 2024
Keysight Technologies, Inc., Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
Alex Grichener, Plymouth, MN (US);
KEYSIGHT TECHNOLOGIES, INC, Santa Rosa, CA (US);
Abstract
A method is provided for determining source match of a test system including an RF source, a vector network analyzer (VNA) and a test port. The method includes connecting a first calibration standard to the test port; generating an RF signal using the RF source, and applying the RF signal to the first calibration standard; measuring a first incident signal of the RF signal at a first receiver of the test system, and measuring a first reflected signal at a second receiver of the test system; connecting a second calibration standard to the test port; measuring a second incident signal of the RF signal at the first receiver of the test system, and measuring a second reflected signal at the second receiver of the test system; and determining the source match of the test system using the first incident and reflected signals and the second incident and reflected signals.